How can millions of tiny emitters be tested at manufacturing scale? A production optical test platform brings semiconductor-style inspection to microLED arrays.
Teradyne has introduced Iris 100, a production-ready optical test platform designed to characterise individual microLED emitters at the throughput required for volume manufacturing.
MicroLED devices are moving beyond laboratory development into applications such as augmented reality displays and optical interconnects for AI data centres. These devices can contain hundreds of thousands to millions of individual emitters, creating a testing challenge: each emitter needs to be checked, but conventional bench-top optical instruments are not suited to the speed and economics of high-volume production.
Iris 100 addresses this by combining a spectrometer and high-resolution camera to measure the spectral response, luminance, and uniformity of individual emitters across an array. Test parallelisation and image-processing algorithms allow an entire array to be characterised rather than measuring emitters one at a time.
The system can also identify defects such as dead or stuck pixels and cluster defects during manufacturing. Its calibration workflow provides traceable absolute measurements, allowing results to be compared across different lots, wafers, and manufacturing sites.
The system is integrated with Iris 100 with its UltraFLEXplus semiconductor test platform, allowing manufacturers to combine optical and electrical testing. The system supports both wafer and final test, potentially allowing microLED testing to be added to existing production test infrastructure.
The development also extends Teradyne’s focus on optical semiconductor testing. The company introduced Photon 100 earlier this year for silicon photonics and co-packaged optics, while its acquisition of Quantifi Photonics in 2025 expanded its capabilities in photonic test.
“Both technologies demand per-emitter test at production throughput, and Iris 100 delivers that today on test infrastructure our customers already run at scale,” says Shannon Poulin, president of Teradyne’s Semiconductor Test division.
For the official announcement, click here.
